Metrology

METROLOGY (UV, Visible, NIR and LWIR)

Meadowlark Optics has excellent capabilities for transmission, reflection and polarization behavior metrology from the UV to the Mid-Wave IR.

Meadowlark Optics has been a leader in polarization optics for nearly thirty-eight years, with award winning products and outstanding metrology capabilities, setting us apart from the competition.

Retardance (Waveplate) Metrology:

• Accuracy ± 0.002 nm for 320 nm to 750 nm range
• Accuracy ± 0.02 nm for 190 to 320 nm
• Subnanometer accuracy to 3.3 microns
• Capabilities out to 25 microns

Reflectance and Transmission Metrology:

• Cary spectrophotometers from 190 nm to 3.3 microns (Sub nanometer resolution)
• A cornucopia of spectrometers for UV to NIR measurements (including solar Fraunhofer line calibrations as required)
• FTIR for 2.5 to 22 micron measurements