Metrology

METROLOGY (UV, Visible, NIR and LWIR)

Meadowlark Optics has excellent capabilities for transmission, reflection and polarization behavior metrology from the UV to the Mid-Wave IR.

Meadowlark Optics has been a leader in polarization optics for nearly thirty-eight years, with award winning products and outstanding metrology capabilities, setting us apart from the competition.

Retardance (Waveplate) Metrology:
  • Accuracy ± 0.002 nm for 320 nm to 750 nm range
  • Accuracy ± 0.02 nm for 190 to 320 nm
  • Subnanometer accuracy to 3.3 microns
  • Capabilities out to 25 microns
Reflectance and Transmission Metrology:
  • Cary spectrophotometers from 190 nm to 3.3 microns (Sub nanometer resolution)
  • A cornucopia of spectrometers for UV to NIR measurements (including solar Fraunhofer line calibrations as required)
  • FTIR for 2.5 to 22 micron measurements